Chemical Analysis by X-ray Flourescence Spectrometer
Chemical analysis by XRF is conducted for a wide range of purposes from material identification and characterisation to quality control monitoring. XRF is a method for measuring elemental contents of samples. The basic principle of XRF involves irradiating the sample with incident X-rays and measuring the secondary X-rays emitted which is characteristic of each element.
X-Ray Fluorescence Spectrophotometer
Typical Analytes
Typical Analytes
- SiO2, Al2O3, TiO2, Fe2O3, Na2O, K2O, CaO, MgO
- Ceramics (tiles, pottery, tableware, sanitaryware)
- Raw materials (clay, sand, feldspar, limestone,
pottery stone...etc) - Refractories